Characterization of refractive index changes of silica glass induced by ion microbeam

M. Hattori, Y. Ohki*, M. Fujimaki, T. Souno, H. Nishikawa, E. Watanabe, M. Oikawa, T. Kamiya, K. Arakawa

*この研究の対応する著者

研究成果: Conference article査読

7 被引用数 (Scopus)

抄録

Distributions of structural and refractive index changes of silica irradiated by H+ microbeam were studied by optical and atomic force microscopes (AFM). The AFM measurements on the microbeam irradiated area show the formation of a groove on the surface. In addition, a cross sectional observation on the surface parallel to the incident plane reveals surface deformation along the ion tracks, which is deepest at the projected range of ions. Taking into account the possible structural changes of silica induced by energy deposition calculated by TRIM, the measured topological changes at the front and side surfaces result from internal compaction of silica glass. Refractive index changes were estimated from the Lorentz-Lorenz relationship using the distribution of the internal compaction estimated by the AFM measurements.

本文言語English
ページ(範囲)272-276
ページ数5
ジャーナルNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
210
DOI
出版ステータスPublished - 2003 9
イベント8th International Conference on Nuclear Microprobe Technology - Takasaki, Japan
継続期間: 2002 9 82002 9 13

ASJC Scopus subject areas

  • 核物理学および高エネルギー物理学
  • 器械工学

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