Comparative analysis of on-chip transmission line de-embedding techniques

S. Amakawa, K. Katayama, K. Takano, T. Yoshida, M. Fujishima

研究成果: Conference contribution

4 被引用数 (Scopus)

抄録

Formal comparative analysis is presented of three known de-embedding and characteristic impedance estimation techniques for on-chip transmission lines, used after probe-tip calibration. Somewhat counterintuitively, experience accumulated in the field seems to suggest that the apparently most simplistic of the three gives much better results than the other two, more "accurate-looking" techniques. The reason, however, never seems to have been explained clearly. This paper attempts to explain why and suggests some new alternative techniques.

本文言語English
ホスト出版物のタイトル2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings
出版社Institute of Electrical and Electronics Engineers Inc.
ページ91-93
ページ数3
ISBN(電子版)9781467377942
DOI
出版ステータスPublished - 2016 1 8
外部発表はい
イベントIEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Sendai, Japan
継続期間: 2015 8 262015 8 28

出版物シリーズ

名前2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings

Other

OtherIEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015
国/地域Japan
CitySendai
Period15/8/2615/8/28

ASJC Scopus subject areas

  • コンピュータ ネットワークおよび通信
  • 電子工学および電気工学

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