Comparative atomic force and scanning electron microscopy for fine structural images of nerve cells

Takuro Tojima, Dai Hatakeyama, Yukako Yamane, Kazushige Kawabata, Tatsuo Ushiki, Shigeaki Ogura, Kazuhiro Abe, Etsuro Ito*

*この研究の対応する著者

研究成果: Article査読

23 被引用数 (Scopus)

抄録

Although we can routinely obtain fine structural images of cells by atomic force microscopy (AFM), the adequacy and reliability of morphological information acquired from these AFM images remain to be examined. In this report, we compared images of the fine structures of nerve cells as observed by both AFM and scanning electron microscopy (SEM). Although AFM revealed the structure of the top views of cells in greater detail than SEM, their side structures were better observed by SEM. The linear structures in the neural processes detected only by AFM were confirmed, by immunofluorescence staining, to be reflections of the cytoskeletal structures located beneath the cell membrane. These differences between the AFM and the SEM images reflected the characteristics of the detection systems and methods used for sample preparation. Therefore, these results revealed that more detailed information on cell morphology can be obtained by using both AFM and SEM to advantage.

本文言語English
ページ(範囲)3855-3859
ページ数5
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
37
6 SUPPL. B
DOI
出版ステータスPublished - 1998 6月
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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