Comparison of broadband impedance spectroscopy and time domain reflectometry for locating cable degradation

Naoshi Hirai*, Takayuki Yamada, Yoshimichi Ohki

*この研究の対応する著者

研究成果: Conference contribution

28 被引用数 (Scopus)

抄録

A new method called the broadband impedance spectroscopy (BIS), which is a kind of frequency domain reflectometry, is being developed as a reliable method for locating a degraded portion of a low voltage cable. The sensitivity of the BIS method is compared to that of the time domain reflectometry (TDR). In the first case, the sheath and insulation of a 50-m-long polyvinyl chloride insulated cable were partially peeled off. In the second case, cables insulated with silicone rubber, flame-retardant ethylene propylene rubber, or cross-linked polyethylene, each about 25 m long, were aged simultaneously by heat and γ-irradiation in air. In both two cases, a clear peak indicating the damaged or aged portion appears in the BIS measurement, while no such a peak appears in the TDR measurement. Therefore, the BIS method is much superior to the TDR method for locating a degraded portion in a cable.

本文言語English
ホスト出版物のタイトルProceedings of 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012
ページ229-232
ページ数4
DOI
出版ステータスPublished - 2012 12月 1
イベント2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012 - Bali, Indonesia
継続期間: 2012 9月 232012 9月 27

出版物シリーズ

名前Proceedings of 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012

Conference

Conference2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012
国/地域Indonesia
CityBali
Period12/9/2312/9/27

ASJC Scopus subject areas

  • 安全性、リスク、信頼性、品質管理

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