TY - GEN
T1 - Comparison of Three Mechanical Parameters as Aging Indicators of Polymeric Insulation
AU - Ohki, Yoshimichi
AU - Miyazaki, Yu
AU - You, Jiayi
AU - Ishii, Hiroyuki
AU - Hirai, Naoshi
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/9/6
Y1 - 2020/9/6
N2 - The degradation appears obviously earlier in mechanical properties than in dielectric properties for many organic insulating polymers when they are aged under adverse environments. Regarding this, elongation-at-break (EAB), tensile strength (TS), and indenter modulus (IM) were measured for cross-linked polyethylene (XLPE), flame-retardant ethylene-propylene rubber (FR-EPR), cross-linked polyolefin (XLPO), silicone rubber (SiR), and soft epoxy resin (SER). As a result, it has become clear that EAB and IM are respectively good aging indicators in early and late stages of aging of FR-EPR and SiR. For SER, EAB can be a good indicator. In comparison, EAB and TS can be aging indicators of XLPE. However, EAB cannot be a good aging indicator of XLPO.
AB - The degradation appears obviously earlier in mechanical properties than in dielectric properties for many organic insulating polymers when they are aged under adverse environments. Regarding this, elongation-at-break (EAB), tensile strength (TS), and indenter modulus (IM) were measured for cross-linked polyethylene (XLPE), flame-retardant ethylene-propylene rubber (FR-EPR), cross-linked polyolefin (XLPO), silicone rubber (SiR), and soft epoxy resin (SER). As a result, it has become clear that EAB and IM are respectively good aging indicators in early and late stages of aging of FR-EPR and SiR. For SER, EAB can be a good indicator. In comparison, EAB and TS can be aging indicators of XLPE. However, EAB cannot be a good aging indicator of XLPO.
KW - EPR
KW - XLPE
KW - XLPO
KW - aging
UR - http://www.scopus.com/inward/record.url?scp=85099379939&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85099379939&partnerID=8YFLogxK
U2 - 10.1109/ICHVE49031.2020.9279440
DO - 10.1109/ICHVE49031.2020.9279440
M3 - Conference contribution
AN - SCOPUS:85099379939
T3 - 7th IEEE International Conference on High Voltage Engineering and Application, ICHVE 2020 - Proceedings
BT - 7th IEEE International Conference on High Voltage Engineering and Application, ICHVE 2020 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 7th IEEE International Conference on High Voltage Engineering and Application, ICHVE 2020
Y2 - 6 September 2020 through 10 September 2020
ER -