Contact probe card with large overdrive

Gunsei Kimoto, Takehiro Watanabe, Souta Matsusaka, Takaharu Kuroda, Mikiko Saito

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

In this paper, we present a new contact probe card with an insulating resin film that can achieve large overdrive. The probe pins were manufactured using Be-Cu through etching and silkscreen polyimide printing. It was confirmed that the probes have a long life expectancy because they act within the thresholds of elastic deformation. The proposed assembly technology allows us to achieve highly accurate probe units with a narrow pitch and a probe thickness of only 28 μm.

本文言語English
ホスト出版物のタイトルStudent Posters (General) - 218th ECS Meeting
出版社Electrochemical Society Inc.
ページ57-67
ページ数11
21
ISBN(印刷版)9781607682271
DOI
出版ステータスPublished - 2010
イベントGeneral Student Poster Session - 218th ECS Meeting - Las Vegas, NV, United States
継続期間: 2010 10 102010 10 15

出版物シリーズ

名前ECS Transactions
番号21
33
ISSN(印刷版)1938-5862
ISSN(電子版)1938-6737

Conference

ConferenceGeneral Student Poster Session - 218th ECS Meeting
国/地域United States
CityLas Vegas, NV
Period10/10/1010/10/15

ASJC Scopus subject areas

  • 工学(全般)

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