抄録
In this paper, we present a new contact probe card with an insulating resin film that can achieve large overdrive. The probe pins were manufactured using Be-Cu through etching and silkscreen polyimide printing. It was confirmed that the probes have a long life expectancy because they act within the thresholds of elastic deformation. The proposed assembly technology allows us to achieve highly accurate probe units with a narrow pitch and a probe thickness of only 28 μm.
| 本文言語 | English |
|---|---|
| ホスト出版物のタイトル | Student Posters (General) - 218th ECS Meeting |
| 出版社 | Electrochemical Society Inc. |
| ページ | 57-67 |
| ページ数 | 11 |
| 版 | 21 |
| ISBN（電子版） | 9781566778770 |
| ISBN（印刷版） | 9781607682271 |
| DOI | |
| 出版ステータス | Published - 2010 |
| イベント | General Student Poster Session - 218th ECS Meeting - Las Vegas, NV, United States 継続期間: 2010 10月 10 → 2010 10月 15 |
出版物シリーズ
| 名前 | ECS Transactions |
|---|---|
| 番号 | 21 |
| 巻 | 33 |
| ISSN（印刷版） | 1938-5862 |
| ISSN（電子版） | 1938-6737 |
Conference
| Conference | General Student Poster Session - 218th ECS Meeting |
|---|---|
| 国/地域 | United States |
| City | Las Vegas, NV |
| Period | 10/10/10 → 10/10/15 |
ASJC Scopus subject areas
- 工学（全般）
UN SDG
この成果は、次の持続可能な開発目標に貢献しています
