Correlation between composition, microstructure, and ferroelectric properties of SrBi2Ta2O9 thin films

Sachiko Ono, Akira Sakakibara, Tomonori Seki, Tetsuya Osaka, Ichiro Koiwa, Juro Mita, Toshiyuki Iwabuchi, Katsuhiko Asami

研究成果: Article査読

14 被引用数 (Scopus)

抄録

SrBi2Ta2O9 thin films prepared by a solution-deposition process were formed at various annealing temperatures. P-E hysteresis loops of the fims exhibited well-defined shapes, and the leakage current decreased with increasing annealing temperature except for one annealed at 750°C. The considerable amount of metallic Bi on the film surface diffused from the inner part was evaluated by a quantitative x-ray photoelectron spectroscopic analysis. A discontinuity in morphology such as cavities detected by transmission electron microscopic observation at grain boundaries between large single-crystal grains and microcrystallite regions, which was pronounced in the film annealed at 750°C, is suggested as inducing an increase in leakage current by the condensation of metallic Bi at the cavities.

本文言語English
ページ(範囲)L185-L187
ジャーナルJournal of the Electrochemical Society
144
7
DOI
出版ステータスPublished - 1997 7

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Renewable Energy, Sustainability and the Environment
  • Surfaces, Coatings and Films
  • Electrochemistry
  • Materials Chemistry

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