Cosmetic features extraction by a single image makeup decomposition

Kanami Yamagishi, Shintaro Yamamoto, Takuya Kato, Shigeo Morishima

研究成果: Conference contribution

抄録

In recent years, a large number of makeup images have been shared on social media. Most of these images lack information about the cosmetics used, such as color, glitter or etc., while they are difficult to infer due to the diversity of skin color or lighting conditions. In this paper, our goal is to estimate cosmetic features only from a single makeup image. Previous work has measured the material parameters of cosmetic products from pairs of images showing the face with and without makeup, but such comparison images are not always available. Furthermore, this method cannot represent local effects such as pearl or glitter since they adapted physically-based reflectance models. We propose a novel image-based method to extract cosmetic features considering both color and local effects by decomposing the target image into makeup and skin color using Difference of Gaussian (DoG). Our method can be applied for single, standalone makeup images, and considers both local effects and color. In addition, our method is robust to the skin color difference due to the decomposition separating makeup from skin. The experimental results demonstrate that our method is more robust to skin color difference and captures characteristics of each cosmetic product.

本文言語English
ホスト出版物のタイトルProceedings - 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2018
出版社IEEE Computer Society
ページ1965-1967
ページ数3
ISBN(電子版)9781538661000
DOI
出版ステータスPublished - 2018 12月 13
イベント31st Meeting of the IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2018 - Salt Lake City, United States
継続期間: 2018 6月 182018 6月 22

出版物シリーズ

名前IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
2018-June
ISSN(印刷版)2160-7508
ISSN(電子版)2160-7516

Other

Other31st Meeting of the IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2018
国/地域United States
CitySalt Lake City
Period18/6/1818/6/22

ASJC Scopus subject areas

  • コンピュータ ビジョンおよびパターン認識
  • 電子工学および電気工学

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