Critical Current Measurement in Three-in-One High-Temperature Superconducting Cables

M. Ohya*, T. Masuda, T. Nakano, O. Maruyama, T. Mimura, S. Honjo

*この研究の対応する著者

研究成果: Article査読

2 被引用数 (Scopus)

抄録

This paper discusses the measurement of critical current IC in three-in-one high-temperature superconducting (HTS) cables. It is difficult to measure the IC of long-length HTS cables by simply connecting a dc power supply to both ends of a single cable core. We propose a go-and-return method, in which the HTS conductor layers of two of the three cores are used to carry current in both directions. A current in the opposite direction is induced in the HTS shield layers. However, the current induction is less than that from ac transmission, and magnetic field leaks from each core. As a result, the measured IC value becomes smaller than the sum of the wires' IC. We used a transient electromagnetic simulation, taking into account the IC-B characteristics of the wires. The estimated I-V waveforms for the 30- and 240-m cable systems are comparable with the measured ones. We have established a practical IC measuring technique that can be used with long-length HTS cable.

本文言語English
論文番号7422025
ジャーナルIEEE Transactions on Applied Superconductivity
26
3
DOI
出版ステータスPublished - 2016 4月
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • 電子工学および電気工学

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