Crystallographic and optical characterizations of Ag(Ga,Al)Te2 layers grown on c -plane sapphire substrates by closed space sublimation

Aya Uruno; Yuji Takeda; Tomohiro Inoue; Masakazu Kobayashi

doi:10.1002/pssc.201510269

Crystallographic and optical characterizations of Ag(Ga,Al)Te₂ layers grown on c -plane sapphire substrates by closed space sublimation

Aya Uruno, Yuji Takeda, Tomohiro Inoue, Masakazu Kobayashi

先進理工学部

研究成果: Article › 査読

11 被引用数 (Scopus)

抄録

Ag(Ga,Al)Te₂ layers were grown by the closed space sublimation method on c -plane sapphire substrates. The source used was AgAlTe₂/AgGaTe₂ mixture or AgAlTe₂/Ga₂Te₃ mixture. The crystallographic property of Ag(Ga,Al)Te₂ layers was analyzed by X-ray diffraction (XRD). XRD spectra of layers exhibited very strong 112 diffraction peaks regardless of the variation of the source material mixture. In addition to crystallographic characterizations, optical properties of the Ag(Ga,Al)Te₂ layer were evaluated through transmittance measurements. The bandgap energy was decreased when the source mole ratio of Al to Ga was decreased. It was revealed that control regulation of x composition of Ag(Ga_1-x,Al_x)Te₂ was feasible by varying the source mole ratio Al/(Ga+Al). (

本文言語	English
ページ（範囲）	413-416
ページ数	4
ジャーナル	Physica Status Solidi (C) Current Topics in Solid State Physics
巻	13
号	7-9
DOI	https://doi.org/10.1002/pssc.201510269
出版ステータス	Published - 2016 7 1

ASJC Scopus subject areas

Condensed Matter Physics

文献へのアクセス

10.1002/pssc.201510269

他のファイルとリンク

フィンガープリント「Crystallographic and optical characterizations of Ag(Ga,Al)Te<sub>2</sub> layers grown on c -plane sapphire substrates by closed space sublimation」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル

@article{c9199da0647b448b832edf6cec95f059,

title = "Crystallographic and optical characterizations of Ag(Ga,Al)Te2 layers grown on c -plane sapphire substrates by closed space sublimation",

abstract = "Ag(Ga,Al)Te2 layers were grown by the closed space sublimation method on c -plane sapphire substrates. The source used was AgAlTe2/AgGaTe2 mixture or AgAlTe2/Ga2Te3 mixture. The crystallographic property of Ag(Ga,Al)Te2 layers was analyzed by X-ray diffraction (XRD). XRD spectra of layers exhibited very strong 112 diffraction peaks regardless of the variation of the source material mixture. In addition to crystallographic characterizations, optical properties of the Ag(Ga,Al)Te2 layer were evaluated through transmittance measurements. The bandgap energy was decreased when the source mole ratio of Al to Ga was decreased. It was revealed that control regulation of x composition of Ag(Ga1-x,Alx)Te2 was feasible by varying the source mole ratio Al/(Ga+Al). (",

keywords = "Ag(Ga,Al)Te2, chalcopyrite, closed space sublimation",

author = "Aya Uruno and Yuji Takeda and Tomohiro Inoue and Masakazu Kobayashi",

year = "2016",

month = jul,

day = "1",

doi = "10.1002/pssc.201510269",

language = "English",

volume = "13",

pages = "413--416",

journal = "Physica Status Solidi C: Conferences",

issn = "1862-6351",

publisher = "Wiley-VCH Verlag",

number = "7-9",

}

TY - JOUR

T1 - Crystallographic and optical characterizations of Ag(Ga,Al)Te2 layers grown on c -plane sapphire substrates by closed space sublimation

AU - Uruno, Aya

AU - Takeda, Yuji

AU - Inoue, Tomohiro

AU - Kobayashi, Masakazu

PY - 2016/7/1

Y1 - 2016/7/1

N2 - Ag(Ga,Al)Te2 layers were grown by the closed space sublimation method on c -plane sapphire substrates. The source used was AgAlTe2/AgGaTe2 mixture or AgAlTe2/Ga2Te3 mixture. The crystallographic property of Ag(Ga,Al)Te2 layers was analyzed by X-ray diffraction (XRD). XRD spectra of layers exhibited very strong 112 diffraction peaks regardless of the variation of the source material mixture. In addition to crystallographic characterizations, optical properties of the Ag(Ga,Al)Te2 layer were evaluated through transmittance measurements. The bandgap energy was decreased when the source mole ratio of Al to Ga was decreased. It was revealed that control regulation of x composition of Ag(Ga1-x,Alx)Te2 was feasible by varying the source mole ratio Al/(Ga+Al). (

AB - Ag(Ga,Al)Te2 layers were grown by the closed space sublimation method on c -plane sapphire substrates. The source used was AgAlTe2/AgGaTe2 mixture or AgAlTe2/Ga2Te3 mixture. The crystallographic property of Ag(Ga,Al)Te2 layers was analyzed by X-ray diffraction (XRD). XRD spectra of layers exhibited very strong 112 diffraction peaks regardless of the variation of the source material mixture. In addition to crystallographic characterizations, optical properties of the Ag(Ga,Al)Te2 layer were evaluated through transmittance measurements. The bandgap energy was decreased when the source mole ratio of Al to Ga was decreased. It was revealed that control regulation of x composition of Ag(Ga1-x,Alx)Te2 was feasible by varying the source mole ratio Al/(Ga+Al). (

KW - Ag(Ga,Al)Te2

KW - chalcopyrite

KW - closed space sublimation

UR - http://www.scopus.com/inward/record.url?scp=84959018695&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84959018695&partnerID=8YFLogxK

U2 - 10.1002/pssc.201510269

DO - 10.1002/pssc.201510269

M3 - Article

AN - SCOPUS:84959018695

VL - 13

SP - 413

EP - 416

JO - Physica Status Solidi C: Conferences

JF - Physica Status Solidi C: Conferences

SN - 1862-6351

IS - 7-9

ER -