C–Si bonded two-dimensional hole gas diamond MOSFET with normally-off operation and wide temperature range stability
Te Bi*, Yuhao Chang, Wenxi Fei, Masayuki Iwataki, Aoi Morishita, Yu Fu, Naoya Niikura, Hiroshi Kawarada
*この研究の対応する著者
研究成果: Article › 査読
15
被引用数
(Scopus)