Current standardization activities relating to the measurement and characterization of nanomaterials and nanostructures are described. The working items relating to single-wall and multiwall carbon nanotubes, which have been discussed by WG2 of ISO TC229 on Nanotechnology, are explained together with the social requests for standardization and the scope and structure of ISO TC229. In addition, the standardization of AFM probe characterization, which is under discussion at ISO TC201 (Surface Chemical Analysis)/SC9 (Scanning Probe Microscopy), is introduced. A new type of probe characterizer necessary for the precise measurement of probe shape is described, and the merit and utility of a probe-shape function that gives the relation between the probe length and width are also explained.
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