Defect analysis and prediction by applying the multistage software reliability growth model

Jieming Chi; Kiyoshi Honda; Hironori Washizaki; Yoshiaki Fukazawa; Kazuki Munakata; Sumie Morita; Tadahiro Uehara; Rieko Yamamoto

doi:10.1109/IWESEP.2017.16

Defect analysis and prediction by applying the multistage software reliability growth model

Jieming Chi, Kiyoshi Honda, Hironori Washizaki, Yoshiaki Fukazawa, Kazuki Munakata, Sumie Morita, Tadahiro Uehara, Rieko Yamamoto

グローバルエデュケーションセンター

研究成果: Conference contribution

12 被引用数 (Scopus)

抄録

In software development, defects are inevitable. To improve reliability, software reliability growth models are useful to analyze projects. Selecting an expedient model can also help with defect predictions, but the model must be well fitted to all the original data. A particular software reliability growth model may not fit all the data well. To overcome this issue, herein we use multistage modeling to fit defect data. In the multistage model, an evaluation is used to divide the data into several parts. Each part is fitted with its own growth model, and the separate models are recombined. As a case study, projects provided by a Japanese enterprise are analyzed by both traditional software reliability growth models and the multistage model. The multistage model has a better performance for data with a poor fit using a traditional software reliability growth model.

本文言語	English
ホスト出版物のタイトル	Proceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017
出版社	Institute of Electrical and Electronics Engineers Inc.
ページ	7-11
ページ数	5
ISBN（電子版）	9781509066995
DOI	https://doi.org/10.1109/IWESEP.2017.16
出版ステータス	Published - 2017 5月 10
イベント	8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017 - Tokyo, Japan 継続期間: 2017 3月 13 → …

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Other	8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017
国/地域	Japan
City	Tokyo
Period	17/3/13 → …

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Chi, J., Honda, K., Washizaki, H., Fukazawa, Y., Munakata, K., Morita, S., Uehara, T., & Yamamoto, R. (2017). Defect analysis and prediction by applying the multistage software reliability growth model. In Proceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017 (pp. 7-11). [7925417] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IWESEP.2017.16

Defect analysis and prediction by applying the multistage software reliability growth model. / Chi, Jieming; Honda, Kiyoshi; Washizaki, Hironori その他.

Proceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 7-11 7925417.

研究成果: Conference contribution

Chi, J, Honda, K, Washizaki, H , Fukazawa, Y, Munakata, K, Morita, S, Uehara, T & Yamamoto, R 2017, Defect analysis and prediction by applying the multistage software reliability growth model. in Proceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017., 7925417, Institute of Electrical and Electronics Engineers Inc., pp. 7-11, 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017, Tokyo, Japan, 17/3/13. https://doi.org/10.1109/IWESEP.2017.16

Chi J, Honda K, Washizaki H , Fukazawa Y, Munakata K, Morita S その他. Defect analysis and prediction by applying the multistage software reliability growth model. In Proceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 7-11. 7925417 doi: 10.1109/IWESEP.2017.16

@inproceedings{108dc18ea31f4556ae05007069394114,

title = "Defect analysis and prediction by applying the multistage software reliability growth model",

abstract = "In software development, defects are inevitable. To improve reliability, software reliability growth models are useful to analyze projects. Selecting an expedient model can also help with defect predictions, but the model must be well fitted to all the original data. A particular software reliability growth model may not fit all the data well. To overcome this issue, herein we use multistage modeling to fit defect data. In the multistage model, an evaluation is used to divide the data into several parts. Each part is fitted with its own growth model, and the separate models are recombined. As a case study, projects provided by a Japanese enterprise are analyzed by both traditional software reliability growth models and the multistage model. The multistage model has a better performance for data with a poor fit using a traditional software reliability growth model.",

keywords = "Growth Model, Multistage Models, Software Reliability",

author = "Jieming Chi and Kiyoshi Honda and Hironori Washizaki and Yoshiaki Fukazawa and Kazuki Munakata and Sumie Morita and Tadahiro Uehara and Rieko Yamamoto",

year = "2017",

month = may,

day = "10",

doi = "10.1109/IWESEP.2017.16",

language = "English",

pages = "7--11",

booktitle = "Proceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

note = "8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017 ; Conference date: 13-03-2017",

}

TY - GEN

T1 - Defect analysis and prediction by applying the multistage software reliability growth model

AU - Chi, Jieming

AU - Honda, Kiyoshi

AU - Washizaki, Hironori

AU - Fukazawa, Yoshiaki

AU - Munakata, Kazuki

AU - Morita, Sumie

AU - Uehara, Tadahiro

AU - Yamamoto, Rieko

PY - 2017/5/10

Y1 - 2017/5/10

N2 - In software development, defects are inevitable. To improve reliability, software reliability growth models are useful to analyze projects. Selecting an expedient model can also help with defect predictions, but the model must be well fitted to all the original data. A particular software reliability growth model may not fit all the data well. To overcome this issue, herein we use multistage modeling to fit defect data. In the multistage model, an evaluation is used to divide the data into several parts. Each part is fitted with its own growth model, and the separate models are recombined. As a case study, projects provided by a Japanese enterprise are analyzed by both traditional software reliability growth models and the multistage model. The multistage model has a better performance for data with a poor fit using a traditional software reliability growth model.

AB - In software development, defects are inevitable. To improve reliability, software reliability growth models are useful to analyze projects. Selecting an expedient model can also help with defect predictions, but the model must be well fitted to all the original data. A particular software reliability growth model may not fit all the data well. To overcome this issue, herein we use multistage modeling to fit defect data. In the multistage model, an evaluation is used to divide the data into several parts. Each part is fitted with its own growth model, and the separate models are recombined. As a case study, projects provided by a Japanese enterprise are analyzed by both traditional software reliability growth models and the multistage model. The multistage model has a better performance for data with a poor fit using a traditional software reliability growth model.

KW - Growth Model

KW - Multistage Models

KW - Software Reliability

UR - http://www.scopus.com/inward/record.url?scp=85020209678&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85020209678&partnerID=8YFLogxK

U2 - 10.1109/IWESEP.2017.16

DO - 10.1109/IWESEP.2017.16

M3 - Conference contribution

AN - SCOPUS:85020209678

SP - 7

EP - 11

BT - Proceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017

Y2 - 13 March 2017

ER -

Defect analysis and prediction by applying the multistage software reliability growth model

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