Defect analysis and prediction by applying the multistage software reliability growth model

Jieming Chi, Kiyoshi Honda, Hironori Washizaki, Yoshiaki Fukazawa, Kazuki Munakata, Sumie Morita, Tadahiro Uehara, Rieko Yamamoto

研究成果: Conference contribution

10 被引用数 (Scopus)

抄録

In software development, defects are inevitable. To improve reliability, software reliability growth models are useful to analyze projects. Selecting an expedient model can also help with defect predictions, but the model must be well fitted to all the original data. A particular software reliability growth model may not fit all the data well. To overcome this issue, herein we use multistage modeling to fit defect data. In the multistage model, an evaluation is used to divide the data into several parts. Each part is fitted with its own growth model, and the separate models are recombined. As a case study, projects provided by a Japanese enterprise are analyzed by both traditional software reliability growth models and the multistage model. The multistage model has a better performance for data with a poor fit using a traditional software reliability growth model.

本文言語English
ホスト出版物のタイトルProceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017
出版社Institute of Electrical and Electronics Engineers Inc.
ページ7-11
ページ数5
ISBN(電子版)9781509066995
DOI
出版ステータスPublished - 2017 5月 10
イベント8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017 - Tokyo, Japan
継続期間: 2017 3月 13 → …

Other

Other8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017
国/地域Japan
CityTokyo
Period17/3/13 → …

ASJC Scopus subject areas

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