Degradation defection methods for electronic circuits

Hiroshi Inujima^*, Uichi Kichijima

^*この研究の対応する著者

研究成果: Article › 査読

本文言語	English
ページ（範囲）	96-105
ページ数	10
ジャーナル	Electrical Engineering in Japan
巻	110
号	1
DOI	https://doi.org/10.1002/eej.4391100111
出版ステータス	Published - 1990
外部発表	はい

ASJC Scopus subject areas

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