Degradation defection methods for electronic circuits

Hiroshi Inujima*

*この研究の対応する著者

研究成果: Conference contribution

抄録

A degradation diagnosis method that detects the degradation symptoms of electronic cards earlier and with higher sensitivity than previous techniques is presented. One type of degraded IC is obtained experimentally by applying a low surge voltage. For the case of the op-amps, there exists a quantitative relation between the degradation of the IC predicted from the increasing off-set current and the correlation with output noise. The root-mean-square value of the noise is an effective index of degradation detection. A method based on a measurement of the minimum value of supply voltage necessary to maintain the correct logical operation is effective in detecting degraded TTLs. An automatic instrument for degradation detection of electronic cards is developed, and its effectiveness is verified.

本文言語English
ホスト出版物のタイトルSignal Processing and System Control Factory Automation
出版社Publ by IEEE
ページ636-641
ページ数6
ISBN(印刷版)0879426004
出版ステータスPublished - 1990 12 1
外部発表はい
イベント16th Annual Conference of IEEE Industrial Electronics Society - IECON'90 - Pacific Grove, CA, USA
継続期間: 1990 11 271990 11 30

出版物シリーズ

名前IECON Proceedings (Industrial Electronics Conference)
1

Other

Other16th Annual Conference of IEEE Industrial Electronics Society - IECON'90
CityPacific Grove, CA, USA
Period90/11/2790/11/30

ASJC Scopus subject areas

  • 制御およびシステム工学
  • 電子工学および電気工学

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