抄録
The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.
本文言語 | English |
---|---|
論文番号 | 085501 |
ジャーナル | Journal of Applied Physics |
巻 | 121 |
号 | 8 |
DOI | |
出版ステータス | Published - 2017 2月 28 |
ASJC Scopus subject areas
- 物理学および天文学(全般)