Degradation of YBCO coated conductors due to over-current pulse

Atsushi Ishiyama*, Yasutake Tanaka, Hiroshi Ueda, Yuh Shiohara, Takato Machi, Yasuhiro Iijima, Takashi Saitoh, Naoji Kashima, Masami Mori, Tomonori Watanabe, Shigeo Nagaya

*この研究の対応する著者

研究成果: Article査読

28 被引用数 (Scopus)

抄録

For HTS (High-Temperature Superconductor) applications to electric power devices, superconductors are subjected to short-circuit fault currents 10 to 30 times the normal operating current. These over-currents will drive the HTS conductors normal and degrade or burn-out the HTS conductors. Therefore it is important to establish a novel thermal stability criterion for over-current pulse drive. In this study, we carried out preliminary experiments on the damage caused by over-current pulse drive focusing on the limitation of the temperature rise without degradation. We prepared five YBCO sample tapes fabricated with IBAD/PLD and IBAD/ MOCVD methods. Measurements were performed at 60 K and 80 K (Conduction cooling with Gifford-McMahon cryocooler was adopted) in self-field. The experimental results indicated that the degradation of the sample tapes for the over-current pulse with a duration of 1 second depended on not the initial critical current Ic, but the peak temperature Tpeak. The permissible peak temperature without degradation existed at about 400-600 K. The sample tapes were also observed before and after the experiments by magneto-optic (MO) imaging to find the distribution of degradation area.

本文言語English
ページ(範囲)3509-3512
ページ数4
ジャーナルIEEE Transactions on Applied Superconductivity
17
2
DOI
出版ステータスPublished - 2007 6月

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • 電子工学および電気工学

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