Depth profiling of APTES self-assembled monolayers using surface-enhanced confocal Raman microspectroscopy

Yingying Sun, Masahiro Yanagisawa, Masahiro Kunimoto, Masatoshi Nakamura, Takayuki Homma*

*この研究の対応する著者

研究成果: Article査読

12 被引用数 (Scopus)

抄録

The internal structure of self-assembled monolayers (SAMs) such as 3-aminopropyltriethoxysilane (APTES) fabricated on a glass substrate is difficult to characterize and analyze at nanometer level. In this study, we employed surface-enhanced Raman spectroscopy (SERS) to study the internal molecular structure of APTES SAMs. The sample APTES SAMs were deposited with Ag nanoparticles to enhance the Raman signal and to obtain subtler structure information, which were supported by density functional theory calculations. In addition, in order to carry out high-resolution analysis, especially for vertical direction, a fine piezo electric positioner was used to control the depth scanning with a step of 0.1 nm. We measured and distinguished the vertical Raman intensity variations of specific groups in APTES, such as Ag/NH2, CH2, and Si[sbnd]O, with high resolution. The interfacial bond at the two interfaces of Ag-APTES and APTES-SiO2 was identified. Moreover, APTES molecule orientation was demonstrated to be inhomogeneous from frequency shift.

本文言語English
ページ(範囲)1-6
ページ数6
ジャーナルSpectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy
184
DOI
出版ステータスPublished - 2017 9 5

ASJC Scopus subject areas

  • 分析化学
  • 原子分子物理学および光学
  • 器械工学
  • 分光学

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