Design method of fault diagnosis of flowmeters using historical database - Evaluation based on probabilities of false-alarm and miss-alarm

Shigeyuki Tateno, Fuqiang Sui, Hisayoshi Matsuyama

研究成果: Conference contribution

抄録

Operation management and equipment control of plants are carried out based on measurements obtained from flowmeters installed in the plants. Therefore, it is necessary to always observe the flowmeters to detect and diagnose faults, and to correct measurements. However, the fault of the flowmeters, such as bias of the indicated value, can be repaired only during regular maintenance under present circumstances. If the flowmeters with bias of the indicated value can be detected beforehand, reasonable repair plans can be planned. In addition, the bias can be corrected during normal plant operation. A fault diagnosis method using historical database is developed for the flowmeters installed in the plant where the state of the plant always changes by influence of load fluctuation. In the previous study, a design method of the fault diagnosis system that can satisfy specifications required from users about probabilities of a miss-diagnosis and an incorrect-diagnosis is developed. This study proposes a new design and pre-evaluation method based on probabilities of a false-alarm and a miss-alarm, which are more important evaluation criteria. The effectiveness of this method is demonstrated by using Monte Carlo simulations of a tank-pipeline system.

本文言語English
ホスト出版物のタイトルICCAS 2007 - International Conference on Control, Automation and Systems
ページ2523-2527
ページ数5
DOI
出版ステータスPublished - 2007 12 1
イベントInternational Conference on Control, Automation and Systems, ICCAS 2007 - Seoul, Korea, Republic of
継続期間: 2007 10 172007 10 20

出版物シリーズ

名前ICCAS 2007 - International Conference on Control, Automation and Systems

Conference

ConferenceInternational Conference on Control, Automation and Systems, ICCAS 2007
国/地域Korea, Republic of
CitySeoul
Period07/10/1707/10/20

ASJC Scopus subject areas

  • 制御およびシステム工学
  • 電子工学および電気工学

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