Detecting the Existence of Malfunctions in Microcontrollers Utilizing Power Analysis

    研究成果: Conference contribution

    2 引用 (Scopus)

    抜粋

    Microcontrollers are widely used in electric devices such as smart phones, televisions, and other smart IoT (Internet-of-Things) devices. Because of the increase of these smart IoT devices, the security of hardware devices becomes a serious concern. In this paper, we propose a method which detects the existence of malfunctions implemented in microcontrollers utilizing power analysis. Our method firstly measures power consumption of the target device and classifies its waveform into the sleep-mode part, in which a microcontroller saves power, and the active-mode part, in which a microcontroller works in a normal operation. After that, we focus on the active-mode part and extract several features from the waveform, which effectively distinguish between normal operations and malfunctions. Finally, we classify the features and identify whether malfunctions exist or not. Our experimental results demonstrate that our proposed method successfully detects the existence of malfunctions in our benchmark.

    元の言語English
    ホスト出版物のタイトル2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design, IOLTS 2018
    編集者Mihalis Maniatakos, Dan Alexandrescu, Dimitris Gizopoulos, Panagiota Papavramidou
    出版者Institute of Electrical and Electronics Engineers Inc.
    ページ97-102
    ページ数6
    ISBN(電子版)9781538659922
    DOI
    出版物ステータスPublished - 2018 9 26
    イベント24th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2018 - Platja D'Aro, Spain
    継続期間: 2018 7 22018 7 4

    Other

    Other24th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2018
    Spain
    Platja D'Aro
    期間18/7/218/7/4

    ASJC Scopus subject areas

    • Hardware and Architecture
    • Software
    • Safety, Risk, Reliability and Quality

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  • これを引用

    Hasegawa, K., Yanagisawa, M., & Togawa, N. (2018). Detecting the Existence of Malfunctions in Microcontrollers Utilizing Power Analysis. : M. Maniatakos, D. Alexandrescu, D. Gizopoulos, & P. Papavramidou (版), 2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design, IOLTS 2018 (pp. 97-102). [8474113] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IOLTS.2018.8474113