Detecting the Existence of Malfunctions in Microcontrollers Utilizing Power Analysis

研究成果: Conference contribution

2 被引用数 (Scopus)

抄録

Microcontrollers are widely used in electric devices such as smart phones, televisions, and other smart IoT (Internet-of-Things) devices. Because of the increase of these smart IoT devices, the security of hardware devices becomes a serious concern. In this paper, we propose a method which detects the existence of malfunctions implemented in microcontrollers utilizing power analysis. Our method firstly measures power consumption of the target device and classifies its waveform into the sleep-mode part, in which a microcontroller saves power, and the active-mode part, in which a microcontroller works in a normal operation. After that, we focus on the active-mode part and extract several features from the waveform, which effectively distinguish between normal operations and malfunctions. Finally, we classify the features and identify whether malfunctions exist or not. Our experimental results demonstrate that our proposed method successfully detects the existence of malfunctions in our benchmark.

本文言語English
ホスト出版物のタイトル2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design, IOLTS 2018
編集者Mihalis Maniatakos, Dan Alexandrescu, Dimitris Gizopoulos, Panagiota Papavramidou
出版社Institute of Electrical and Electronics Engineers Inc.
ページ97-102
ページ数6
ISBN(電子版)9781538659922
DOI
出版ステータスPublished - 2018 9 26
イベント24th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2018 - Platja D'Aro, Spain
継続期間: 2018 7 22018 7 4

出版物シリーズ

名前2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design, IOLTS 2018

Other

Other24th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2018
CountrySpain
CityPlatja D'Aro
Period18/7/218/7/4

ASJC Scopus subject areas

  • Hardware and Architecture
  • Software
  • Safety, Risk, Reliability and Quality

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