Detection of careless mistakes during programming learning using a simple electroencephalograph

Katsuyuki Umezawa, Makoto Nakazawa, Manabu Kobayashi, Yutaka Ishii, Michiko Nakano, Shigeichi Hirasawa

研究成果: Conference contribution

抄録

There are several difficulties encountered by learners during learning such as good or bad learning content, the difficulty level of learning content, and the degree of learning proficiency. It is possible to detect these difficulties by measuring the browsing history, editing history, and biological information such as brain waves or eye-tracking information. In this paper, we measure electroencephalograph (EEG) information during programming learning. We focus on the relationship between task response time and EEG, and try to detect careless mistakes due to the lack of attention. The results show that careless mistakes during programming learning can be detected by experiments.

本文言語English
ホスト出版物のタイトル15th International Conference on Computer Science and Education, ICCSE 2020
出版社Institute of Electrical and Electronics Engineers Inc.
ページ72-77
ページ数6
ISBN(電子版)9781728172675
DOI
出版ステータスPublished - 2020 8
イベント15th International Conference on Computer Science and Education, ICCSE 2020 - Virtual, Delft, Netherlands
継続期間: 2020 8 182020 8 20

出版物シリーズ

名前15th International Conference on Computer Science and Education, ICCSE 2020

Conference

Conference15th International Conference on Computer Science and Education, ICCSE 2020
国/地域Netherlands
CityVirtual, Delft
Period20/8/1820/8/20

ASJC Scopus subject areas

  • コンピュータ サイエンス(その他)
  • 人間とコンピュータの相互作用
  • メディア記述
  • 発達心理学および教育心理学
  • 教育

フィンガープリント

「Detection of careless mistakes during programming learning using a simple electroencephalograph」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル