Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite

Hiroki Asakawa, Masashi Natsui, Yoshimichi Ohki, Toshikatsu Tanaka, Takashi Maeno, Kenji Okamoto

研究成果: Conference contribution

抄録

In order to study the growth of electrochemical migration along the thickness direction, paper/phenol-resin composite on printed wiring boards was aged at 85 °C and 85%RH by applying of a dc voltage. Then, the sample was observed by a scanning electron microscope with a function of energy dispersive spectroscopy (SEM-EDS) analysis. Space charge distributions in the sample were also measured by the pulsed electroacoustic method. Signals of SEM-EDS showing the presence of Cu were observed on both the anode and cathode. This fact indicates that ionized copper moves toward the cathode inside the composite when an electric field is applied at high temperatures in a highly humid atmosphere.

本文言語English
ホスト出版物のタイトルProceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010
DOI
出版ステータスPublished - 2010 10 25
イベント2010 IEEE International Conference on Solid Dielectrics, ICSD 2010 - Potsdam, Germany
継続期間: 2010 7 42010 7 9

出版物シリーズ

名前Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010

Other

Other2010 IEEE International Conference on Solid Dielectrics, ICSD 2010
CountryGermany
CityPotsdam
Period10/7/410/7/9

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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