Detection of unexpected situations by applying software reliability growth models to test phases

Kiyoshi Honda, Hironori Washizaki, Yoshiaki Fukazawa, Kazuki Munakata, Sumie Morita, Tadahiro Uehara, Rieko Yamamoto

研究成果: Conference contribution

5 引用 (Scopus)

抄録

In software development, software reliability growth models (SRGMs) often provide values that do not meet expectations; sometimes the results of the SRGM and the actual data disagree and other times the SRGM overestimates the expected values. The former often occurs in model curves and the predicted number of faults. For example, the software reliability growth curve cannot describe the situation where developers stop testing multiple times because the equations in SRGMs cannot treat such information. The latter can arise when the total number of expected faults is 100, but the SRGM indicates 1000. If developers encounter such situations, they often doubt the SRGM results and hesitate using SRGMs for predictions. In this study, we apply two different cases of SRGM. Two projects of Fujitsu Labs Ltd. are analyzed using SRGM either for the entire dataset or each test phase. Based on the results and interviews with the developers, we found that the model using separate test phases provides a better fit because faults counted in each test phase have different viewpoints and the deviation between SRGM and expectations indicates a problem with development.

元の言語English
ホスト出版物のタイトル2015 IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015
出版者Institute of Electrical and Electronics Engineers Inc.
ページ2-5
ページ数4
ISBN(電子版)9781509019441
DOI
出版物ステータスPublished - 2016 1 25
イベントIEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015 - Gaithersburg, United States
継続期間: 2015 11 22015 11 5

Other

OtherIEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015
United States
Gaithersburg
期間15/11/215/11/5

Fingerprint

Software reliability
Software engineering

ASJC Scopus subject areas

  • Software
  • Safety, Risk, Reliability and Quality

これを引用

Honda, K., Washizaki, H., Fukazawa, Y., Munakata, K., Morita, S., Uehara, T., & Yamamoto, R. (2016). Detection of unexpected situations by applying software reliability growth models to test phases. : 2015 IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015 (pp. 2-5). [7392024] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSREW.2015.7392024

Detection of unexpected situations by applying software reliability growth models to test phases. / Honda, Kiyoshi; Washizaki, Hironori; Fukazawa, Yoshiaki; Munakata, Kazuki; Morita, Sumie; Uehara, Tadahiro; Yamamoto, Rieko.

2015 IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015. Institute of Electrical and Electronics Engineers Inc., 2016. p. 2-5 7392024.

研究成果: Conference contribution

Honda, K, Washizaki, H, Fukazawa, Y, Munakata, K, Morita, S, Uehara, T & Yamamoto, R 2016, Detection of unexpected situations by applying software reliability growth models to test phases. : 2015 IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015., 7392024, Institute of Electrical and Electronics Engineers Inc., pp. 2-5, IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015, Gaithersburg, United States, 15/11/2. https://doi.org/10.1109/ISSREW.2015.7392024
Honda K, Washizaki H, Fukazawa Y, Munakata K, Morita S, Uehara T その他. Detection of unexpected situations by applying software reliability growth models to test phases. : 2015 IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015. Institute of Electrical and Electronics Engineers Inc. 2016. p. 2-5. 7392024 https://doi.org/10.1109/ISSREW.2015.7392024
Honda, Kiyoshi ; Washizaki, Hironori ; Fukazawa, Yoshiaki ; Munakata, Kazuki ; Morita, Sumie ; Uehara, Tadahiro ; Yamamoto, Rieko. / Detection of unexpected situations by applying software reliability growth models to test phases. 2015 IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 2-5
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