Accurate determination of microphone sensitivity is important to build reliable acoustical instruments. The sensitivity is usually determined by calibration. However, because available microphone calibration methods determine the sensitivity from a mathematical model derived from the geometry of a conventional condenser microphone, they cannot be applied to the calibration of microelectromechanical systems (MEMS) microphone straightforwardly. To compromise this geometry difference with the available calibration methods, some authors have proposed the development of adapters that fits the conventional calibration apparatus and modified the calibration procedure. In this paper, we propose a different approach to calibrate the MEMS microphone. The sensitivity is calculated directly from the measurement of the sound field applied to the MEMS microphone and its output voltage. The projection of the sound field is measured by parallel phase-shifting interferometry (PPSI), and sound pressure on the MEMS microphone is obtained by tomographic reconstruction. Experimental calibration of a MEMS microphone was performed and validated using a microphone substitution method to evaluate the discrepancies of the sensitivity result. It is shown that the proposed method can be used to determine the frequency response of the MEMS microphone in the frequency range of 1000 Hz to 12000 Hz.
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