Development and application of multiple-probe scanning probe microscopes

Tomonobu Nakayama, Osamu Kubo*, Yoshitaka Shingaya, Seiji Higuchi, Tsuyoshi Hasegawa, Chun Sheng Jiang, Taichi Okuda, Yuji Kuwahara, Kazuhiro Takami, Masakazu Aono

*この研究の対応する著者

研究成果: Article査読

46 被引用数 (Scopus)

抄録

In the research of advanced materials based on nanoscience and nanotechnology, it is often desirable to measure nanoscale local electrical conductivity at a designated position of a given sample. For this purpose, multiple-probe scanning probe microscopes (MP-SPMs), in which two, three or four scanning tunneling microscope (STM) or atomic force microscope (AFM) probes are operated independently, have been developed. Each probe in an MP-SPM is used not only for observing high-resolution STM or AFM images but also for forming an electrical contact enabling nanoscale local electrical conductivity measurement. The world's first double-probe STM (DP-STM) developed by the authors, which was subsequently modified to a triple-probe STM (TP-STM), has been used to measure the conductivities of one-dimensional metal nanowires and carbon nanotubes and also two-dimensional molecular films. A quadruple-probe STM (QP-STM) has also been developed and used to measure the conductivity of two-dimensional molecular films without the ambiguity of contact resistance between the probe and sample. Moreover, a quadruple-probe AFM (QP-AFM) with four conductive tuning-fork-type self-detection force sensing probes has been developed to measure the conductivity of a nanostructure on an insulating substrate. A general-purpose computer software to control four probes at the same time has also been developed and used in the operation of the QP-AFM. These developments and applications of MP-SPMs are reviewed in this paper. Multiple-probe scanning probe microscopes (MP-SPMs), in which 2, 3, or 4 scanning tunneling microscope or atomic force microscope probes are operated independently, have been developed. MP-SPMs are helpful to measure nanoscale local electrical conductivity at a designated position of a given sample and promote research of advanced materials based on nanotechnology. Recent developments and applications of MP-SPMs are reviewed in this paper.

本文言語English
ページ(範囲)1675-1692
ページ数18
ジャーナルAdvanced Materials
24
13
DOI
出版ステータスPublished - 2012 4月 3
外部発表はい

ASJC Scopus subject areas

  • 材料科学(全般)
  • 材料力学
  • 機械工学

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