抄録
The widespread use of the SQUID-NDE requires the visualization of defects. We have developed a method to obtain depth information by monitoring the SQUID output while changing the frequency of the current flowing in a sample. The effectiveness of this method was verified by experiment and simulation.
本文言語 | English |
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ページ(範囲) | 1311-1314 |
ページ数 | 4 |
ジャーナル | IEEE Transactions on Applied Superconductivity |
巻 | 11 |
号 | 1 I |
DOI | |
出版ステータス | Published - 2001 3月 |
イベント | 2000 Applied Superconductivity Conference - Virginia Beach, VA, United States 継続期間: 2000 9月 17 → 2000 9月 22 |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 凝縮系物理学
- 電子工学および電気工学