Development of deterioration diagnosis technique for bus Joint in Switchboards with temperature fluctuation

Yoshiyuki Takagi, Hiroshi Inujima

研究成果: Article

抜粋

We developed deterioration diagnosis technique for bus Joint in Switchboards. Increase of contact resistance by deterioration of a bus joint causes a temperature rise. However, it is difficult to really measure a temperature rise by a minute change of contact resistance. That is a method to detect a change of contact resistance of a bus joint as a temperature fluctuation. We expect that a serious accident such as a short circuit is prevented beforehand by this technique.

元の言語English
ページ(範囲)584-587+4
ジャーナルieej transactions on industry applications
128
発行部数5
DOI
出版物ステータスPublished - 2008 12 1

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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