Development of deterioration diagnosis technique for bus Joint in Switchboards with temperature fluctuation

Yoshiyuki Takagi*, Hiroshi Inujima

*この研究の対応する著者

研究成果: Article査読

抄録

We developed deterioration diagnosis technique for bus Joint in Switchboards. Increase of contact resistance by deterioration of a bus joint causes a temperature rise. However, it is difficult to really measure a temperature rise by a minute change of contact resistance. That is a method to detect a change of contact resistance of a bus joint as a temperature fluctuation. We expect that a serious accident such as a short circuit is prevented beforehand by this technique.

本文言語English
ページ(範囲)584-587+4
ジャーナルieej transactions on industry applications
128
5
DOI
出版ステータスPublished - 2008

ASJC Scopus subject areas

  • 産業および生産工学
  • 電子工学および電気工学

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