抄録
We developed deterioration diagnosis technique for bus Joint in Switchboards. Increase of contact resistance by deterioration of a bus joint causes a temperature rise. However, it is difficult to really measure a temperature rise by a minute change of contact resistance. That is a method to detect a change of contact resistance of a bus joint as a temperature fluctuation. We expect that a serious accident such as a short circuit is prevented beforehand by this technique.
本文言語 | English |
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ページ(範囲) | 584-587+4 |
ジャーナル | ieej transactions on industry applications |
巻 | 128 |
号 | 5 |
DOI | |
出版ステータス | Published - 2008 |
ASJC Scopus subject areas
- 産業および生産工学
- 電子工学および電気工学