Development of helium-microwave-induced plasma-atomic emission spectroscopy system with two-way spectroscopic analysis

Satoshi Ikezawa, Jun Yamamoto, Toshitsugu Ueda

    研究成果: Conference contribution

    抄録

    This paper reports on a helium-microwave-induced plasma-atomic emission spectroscopy (He-MIP-AES) system with two-way spectroscopic analysis that fulfills the criteria prescribed by the Ministry of Environment, Japan, for measuring the chemical components of particulate matter (PM). The He-MIP-AES system is a reconstruction of a commercial particle analyzer system. In current environmental monitoring systems, PMs are typically collected on trapping filters placed across Japan and classified as either suspended particulate matter (SPM) or PM2.5 depending on the size. The collected PMs are subsequently analyzed with automated measurement instruments such as a piezo balance and with methods such as beta ray attenuation and light scattering. While these measurement methods allow the mass concentration of PMs in the air to be obtained at hourly intervals, the chemical composition of individual particles is analyzed with time-intensive laboratory procedures. In contrast, the presented measurement system allows the chemical compositions and particle sizes to be measured simultaneously in real time.

    本文言語English
    ホスト出版物のタイトルProceedings of the International Conference on Sensing Technology, ICST
    出版社IEEE Computer Society
    ページ716-721
    ページ数6
    2016-March
    ISBN(印刷版)9781479963140
    DOI
    出版ステータスPublished - 2016 3 21
    イベント9th International Conference on Sensing Technology, ICST 2015 - Auckland, New Zealand
    継続期間: 2015 12 82015 12 11

    Other

    Other9th International Conference on Sensing Technology, ICST 2015
    CountryNew Zealand
    CityAuckland
    Period15/12/815/12/11

    ASJC Scopus subject areas

    • Artificial Intelligence
    • Computer Science Applications
    • Signal Processing
    • Electrical and Electronic Engineering

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