Development of standards for reliable surface analyses by ISO technical committee 201 on surface chemical analysis

C. J. Powell*, R. Shimizu, K. Yoshihara, S. Ichimura

*この研究の対応する著者

研究成果: Article査読

6 被引用数 (Scopus)

抄録

The need for reliable surface analyses together with quality-management requirements for analytical laboratories led the International Organization for Standardization (ISO) to formits Technical Committee (TC) 201 on Surface Chemical Analysis in 1991. This article describes the organization of TC 201, the strategies that have been found useful for identifying and assessing possible projects for new international standards, and the 57 international standards and other documents prepared to date by TC 201. Standards have now been developed for Auger-electron spectroscopy, glow-discharge spectroscopy, various types of scanning probe microscopy, secondary-ion mass spectrometry, sputter-depth profiling, total-reflection X-ray fluorescence spectroscopy, X-ray photoelectron spectroscopy, and X-ray reflectometry. In addition, standards have been developed with definitions of terms used in surface chemical analysis; the handling, preparation of specimens for surface analysis; information and data-transfer formats; and methods for determining the lateral resolution of beam-based methods of surface analysis.

本文言語English
ページ(範囲)127-134
ページ数8
ジャーナルSurface and Interface Analysis
47
1
DOI
出版ステータスPublished - 2015 1月 1
外部発表はい

ASJC Scopus subject areas

  • 化学 (全般)
  • 凝縮系物理学
  • 表面および界面
  • 表面、皮膜および薄膜
  • 材料化学

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