Development of the damage assessment methodology for ceiling elements

Yoshihiro Nitta*, Atsumi Iwasaki, Akira Nishitani, Morimasa Wakatabe, Shinsuke Inai, Iwao Ohdomari, Hiroki Tsutsumi

*この研究の対応する著者

研究成果

2 被引用数 (Scopus)

抄録

This paper presents the basic concept of a damage assessment methodology for ceiling elements with the aid of smart sensor board and inspection robot. In this proposed system, the distributed smart sensor boards firstly detect the fact of damage occurrence. Next, the robot inspects the damage location and captures the photographic image of damage condition. The smart sensor board for the proposed system mainly consists of microcontroller, strain gage and LAN module. The inspection robot integrated into the proposed system has a wireless camera and wireless LAN device for receiving signal to manipulate itself. At first, the effectiveness of the smart sensor board and inspection robot is tested by experiments of a full-scale suspended ceiling utilizing shaking table facilities. The model ceiling is subjected to several levels of excitations and thus various levels of damages are caused. Next, this robot inspection scheme is applied to the ceiling of a real structure damaged by the 2011 off the pacific coast of Tohoku Earthquake. The obtained results indicate that the proposed system can detect the location and condition of the damage.

本文言語English
ホスト出版物のタイトルSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2012
DOI
出版ステータスPublished - 2012
イベントSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2012 - San Diego, CA, United States
継続期間: 2012 3 122012 3 15

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
8345
ISSN(印刷版)0277-786X

Conference

ConferenceSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2012
国/地域United States
CitySan Diego, CA
Period12/3/1212/3/15

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学

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