TY - GEN
T1 - Device Data Application Phase1 on Trusted Data Platform GAIA-X for Decarbonization in Industry
AU - Ito, Akio
AU - Sakaino, Akira
AU - Chino, Shinichiro
AU - Horikoshi, Takashi
AU - Fujishima, Mitsushiro
AU - Ogawa, Shuichi
AU - Takeuchi, Tetsuo
AU - Amano, Yoshiharu
N1 - Funding Information:
Authors express special acknowledgement for IAF CLiC (Control Layer Informational Cooperation) members who cooperated with developing the MES study part of the proving test equipment for FA side.
Publisher Copyright:
© 2022 The Society of Instrument and Control Engineers - SICE.
PY - 2022
Y1 - 2022
N2 - We started investigation of a proving test equipment development which corresponds to field device tool (FDT®, IEC62453) ver. 3.0 (FDT 3.0) to study theoretically the issues of field device level requirements for industrial smart system design. We select carbon emission data international trade system using European secure data-sharing platform GAIA-X as the target future production system which utilizes FDT3.0. We created a proving test equipment architecture for all automation industry domain including process automation (PA) and factory automation (FA). Manufacturing Execution Systems (MES) study part of the proving test equipment for FA side is constructed and demonstrated at IIFES2022 in collaboration with IAF. We will continue our research to show the use cases which utilizes device data effectively.
AB - We started investigation of a proving test equipment development which corresponds to field device tool (FDT®, IEC62453) ver. 3.0 (FDT 3.0) to study theoretically the issues of field device level requirements for industrial smart system design. We select carbon emission data international trade system using European secure data-sharing platform GAIA-X as the target future production system which utilizes FDT3.0. We created a proving test equipment architecture for all automation industry domain including process automation (PA) and factory automation (FA). Manufacturing Execution Systems (MES) study part of the proving test equipment for FA side is constructed and demonstrated at IIFES2022 in collaboration with IAF. We will continue our research to show the use cases which utilizes device data effectively.
KW - Decarbonization
KW - Device data
KW - FDT3.0
KW - GAIA-X
KW - Trusted data
UR - http://www.scopus.com/inward/record.url?scp=85141175809&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85141175809&partnerID=8YFLogxK
U2 - 10.23919/SICE56594.2022.9905865
DO - 10.23919/SICE56594.2022.9905865
M3 - Conference contribution
AN - SCOPUS:85141175809
T3 - 2022 61st Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2022
SP - 17
EP - 24
BT - 2022 61st Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 61st Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2022
Y2 - 6 September 2022 through 9 September 2022
ER -