High-field conduction and dielectric breakdown characteristics of plasma-polymerized films of ethylene and trifluoromethane (PPEF) and those of ethylene (PPE) were studied. Based on experimental results on the prebreakdown current, time lag to breakdown, and thickness or electrode metal dependence on dielectric strength, it is shown that the breakdown is caused by hole avalanche and that scattering of holes by fluorine atoms results in higher dielectric strength in PPEF than in PPE.
|ジャーナル||Conference Record of IEEE International Symposium on Electrical Insulation|
|出版ステータス||Published - 1990 12月 1|
|イベント||Conference Record of the 1990 IEEE International Symposium on Electrical Insulation - Toronto, Ca|
継続期間: 1990 6月 3 → 1990 6月 6
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