Dielectric breakdown due to hole avalanche in plasma polymer films

K. Ishii, Y. Ohki, T. Nakano

研究成果: Conference article査読

1 被引用数 (Scopus)

抄録

High-field conduction and dielectric breakdown characteristics of plasma-polymerized films of ethylene and trifluoromethane (PPEF) and those of ethylene (PPE) were studied. Based on experimental results on the prebreakdown current, time lag to breakdown, and thickness or electrode metal dependence on dielectric strength, it is shown that the breakdown is caused by hole avalanche and that scattering of holes by fluorine atoms results in higher dielectric strength in PPEF than in PPE.

本文言語English
ページ(範囲)76-79
ページ数4
ジャーナルConference Record of IEEE International Symposium on Electrical Insulation
出版ステータスPublished - 1990 12 1
イベントConference Record of the 1990 IEEE International Symposium on Electrical Insulation - Toronto, Ca
継続期間: 1990 6 31990 6 6

ASJC Scopus subject areas

  • 電子工学および電気工学
  • 建築および建設

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