TY - JOUR
T1 - Dielectric properties and PD resistance of epoxy/fumed and precipitated silica and alumina nanocomposites
AU - Tanaka, Toshikatsu
AU - Iizuka, Tomonori
AU - Meichsner, Christian
AU - Gröppel, Peter
AU - Heinl, Dieter
AU - Weidner, Jürgen R.
PY - 2012
Y1 - 2012
N2 - Epoxy/fumed and precipitated silica and alumina nanocomposites were evaluated on their dielectric properties and partial discharge (PD) resistance. Dielectric properties, i.e., permittivity and dissipation factor tanδ were measured in the frequency range from 20 Hz to 1 MHz. PD resistance was assessed using a rod-to-plane electrode with an air gap 0.2 mm under 4 kVrms. A new discovery was made for moisture and chemical residue effects for the dielectric properties. Natural moisture would not affect much permanent dielectric properties. It was elucidated that nano filler addition would enhance PD resistance, as expected. Furthermore, it was found that epoxy/silica nanocomposite is better in PD resistance than epoxy/alumina nanocomposite. Filler preparation methods, i.e., fumed and precipitated, might influence both properties.
AB - Epoxy/fumed and precipitated silica and alumina nanocomposites were evaluated on their dielectric properties and partial discharge (PD) resistance. Dielectric properties, i.e., permittivity and dissipation factor tanδ were measured in the frequency range from 20 Hz to 1 MHz. PD resistance was assessed using a rod-to-plane electrode with an air gap 0.2 mm under 4 kVrms. A new discovery was made for moisture and chemical residue effects for the dielectric properties. Natural moisture would not affect much permanent dielectric properties. It was elucidated that nano filler addition would enhance PD resistance, as expected. Furthermore, it was found that epoxy/silica nanocomposite is better in PD resistance than epoxy/alumina nanocomposite. Filler preparation methods, i.e., fumed and precipitated, might influence both properties.
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U2 - 10.1109/CEIDP.2012.6378775
DO - 10.1109/CEIDP.2012.6378775
M3 - Conference article
AN - SCOPUS:84872088116
SP - 279
EP - 282
JO - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
JF - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
SN - 0084-9162
M1 - 6378775
T2 - 2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2012
Y2 - 14 October 2012 through 17 October 2012
ER -