Partial discharge (PD) degradation was investigated to compare polyamide nanocomposites with two kinds of polyamide microcomposites. Such materials were exposed to PDs under the IEC(b) electrode configuration for evaluation of PD resistance. Comparisons were made as to the surface roughness using a scanning electron microscope, an atomic force microscope, and a mechanical surface profilometer. It is concluded that polyamide nanocomposite is more resistant to PDs than microcomposites, and that nanoeffects would work against PD degradation, which include filler-matrix bonding, inter-filler space, morphology, and mesoscopic interaction.
|ジャーナル||Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP|
|出版ステータス||Published - 2004 12月 1|
|イベント||2004 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP - Boulder, CO, United States|
継続期間: 2004 10月 17 → 2004 10月 20
ASJC Scopus subject areas