Differential heterodyne optical probe using a Zeeman-laser

Shinichi Komatsu, H. Suhara, H. Ohzu

    研究成果: Conference contribution

    1 被引用数 (Scopus)

    抄録

    Optical scanning microscopy has been widely used to detect light scattering particles or lattice defects in crystals. On the other hand, optical heterodyne technique using a local heterodyne optical system has been adopted by some authors for aberration free image formation. In this study we developed a light scattering microscope with a differential heterodyne optical system simplified in its configuration by the use of a Zeeman laser, and the feasibility of the system was examined experimentally. Differential heterodyne optical system has the advantage of gaining strong scattered light, simple congiguration, and applicability to the detection of other kinds of physical quantities such as acoustic waves and optically induced electric currents.

    本文言語English
    ホスト出版物のタイトルProceedings of SPIE - The International Society for Optical Engineering
    出版社SPIE
    ページ299-300
    ページ数2
    813
    DOI
    出版ステータスPublished - 1987

    ASJC Scopus subject areas

    • 応用数学
    • コンピュータ サイエンスの応用
    • 電子工学および電気工学
    • 電子材料、光学材料、および磁性材料
    • 凝縮系物理学

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