抄録
A digital integration technique based on the use of V/F and D/A converters accompanied by the digital scanning and the synchronous square-wave modulation has been introduced in the scanning Auger electron microscopy. This integrator allows us to perform integration in very high efficiency leading to high signal to noise ratio and to high spatial resolution of the Auger pictures.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 95-97 |
| ページ数 | 3 |
| ジャーナル | Review of Scientific Instruments |
| 巻 | 51 |
| 号 | 1 |
| DOI | |
| 出版ステータス | Published - 1980 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 器械工学