Direct confirmation of the high coherency of the electron beam from a nanotip

Tsuyoshi Ishikawa, Boklae Cho, Eiji Rokuta, Chuhei Oshima

研究成果: Article査読

3 被引用数 (Scopus)

抄録

The coherency of an electron beam from a nanotip was evaluated and compared to that from a tungsten (110) oriented tip by using nano-biprisms in a field-emission projection microscope (FPM). The FPM images were consistent with the corresponding field emission patterns of the employed tip. The nanotip generated much sharper biprism interference patterns than the W(110) tip, and comparison of the visibilities of interference patterns demonstrated directly that a highly coherent electron beam was emitted from the nanotip.

本文言語English
ページ(範囲)770011-770013
ページ数3
ジャーナルApplied Physics Express
1
7
DOI
出版ステータスPublished - 2008 7

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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