Distributed BIST technique and its test design platform for VLSIs

Takeshi Ikenaga, Takeshi Ogura

研究成果: Article査読

1 被引用数 (Scopus)

抄録

This paper proposes a distributed built-in self-test (BIST) technique and its test design platform for VLSIs. This BIST has lower hardware overhead pattern generators, compressors and a controller. The platform cuts down on the number of complicated operations needed for the BIST insertion and evaluation, so the BIST implementation turn-around-time (TAT) is dramatically reduced. Experimental results for the 110k-gate arithmetic execution blocks of an image-processing LSI show that using this BIST structure and platform enables the entire BIST implementation within five days. The implemented BIST has a 1% hardware overhead and 96% fault coverage. This platform will significantly reduce testing costs for time-to-market and mass-produced LSIs.

本文言語English
ページ(範囲)1618-1623
ページ数6
ジャーナルIEICE Transactions on Electronics
E78-C
11
出版ステータスPublished - 1995 11 1
外部発表はい

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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