Drain Current Density over 1.1 A/mm in 2D Hole Gas Diamond MOSFETs with Regrown p++-Diamond Ohmic Contacts
Shoichiro Imanishi, Ken Kudara, Hitoshi Ishiwata, Kiyotaka Horikawa, Shotaro Amano, Masayuki Iwataki, Aoi Morishita, Atsushi Hiraiwa, Hiroshi Kawarada*
*この研究の対応する著者
研究成果: Article › 査読
16
被引用数
(Scopus)