Dynamically changeable secure scan architecture against scan-based side channel attack

Yuta Atobe*, Youhua Shi, Masao Yanagisawa, Nozomu Togawa

*この研究の対応する著者

研究成果: Conference contribution

35 被引用数 (Scopus)

抄録

Scan test which is one of the useful design for testability techniques is effective for LSIs including cryptographic circuit. It can observe and control the internal states of the circuit under test by using scan chain. However, scan chain presents a significant security risk of information leakage for scan-based attacks which retrieves secret keys of cryptographic LSIs. In this paper, a secure scan architecture against scan-based attack which still has high testability is proposed. In our method, scan data is dynamically changed by adding the latch to any FFs in the scan chain. We show that by using proposed method, neither the secret key nor the testability of an RSA circuit implementation is compromised, and the effectiveness of the proposed method.

本文言語English
ホスト出版物のタイトルISOCC 2012 - 2012 International SoC Design Conference
ページ155-158
ページ数4
DOI
出版ステータスPublished - 2012 12月 1
イベント2012 International SoC Design Conference, ISOCC 2012 - Jeju Island, Korea, Republic of
継続期間: 2012 11月 42012 11月 7

出版物シリーズ

名前ISOCC 2012 - 2012 International SoC Design Conference

Conference

Conference2012 International SoC Design Conference, ISOCC 2012
国/地域Korea, Republic of
CityJeju Island
Period12/11/412/11/7

ASJC Scopus subject areas

  • ハードウェアとアーキテクチャ
  • 電子工学および電気工学

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