Edge-enhanced soft X-ray phase-contrast microscopy exploiting the near K-edge optical properties of carbon

Andrew Domondon*, Nandor Bokor, Yoshinori Iketaki

*この研究の対応する著者

研究成果: Article査読

抄録

This paper proposes a method of microscopy we call "edge-enhanced soft X-ray phase-contrast microscopy". It employs a Hilbert-transform microscope setup and exploits the fact that for the same soft X-ray wavelength there is a marked difference in the refractive index for water and carbon. This method produces an edge-enhancement phase contrast image of the molecules that results from the difference in how the X-rays interact with water and the organic molecule of interest. Since this method can detect very small phase jumps, it enables one to observe molecules in vivo with high spatial resolution and high contrast. The results of simulating the technique using the absorption spectrum of tryptophan are presented and suggest that the proposed method will be useful for obtaining images of biological molecules in vivo.

本文言語English
ページ(範囲)521-523
ページ数3
ジャーナルIEEJ Transactions on Electronics, Information and Systems
134
4
DOI
出版ステータスPublished - 2014

ASJC Scopus subject areas

  • 電子工学および電気工学

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