Effect of surface morphology on ionic response of reference field effect transistor

Shigeki Kuroiwa, Tomomi Shibasaki, Tetsuya Osaka

研究成果: Article査読

1 被引用数 (Scopus)

抄録

Fabricating reference field effect transistor (FET) sensors instead of reference electrodes are important for the miniaturization and variegated applications of FET sensors. To make a reference FET, the gate surface of FET was modified with the self-assembled monolayer (SAM) of n- octadecyltrimethoxysilane (ODS). Though an ODSSAM FET had low pH-sensitivity, it was cation-sensitive. This work demonstrates the relation between the surface morphology and the cationic and pH-sensitivity of ODS-SAM FETs. A roughness parameter of atomic force microscope images, the mean summit curvature (Ssc) has correlation with the cationic and pH-sensitivity of ODS-SAM FETs.

本文言語English
ページ(範囲)143-145
ページ数3
ジャーナルElectrochemistry
78
2
DOI
出版ステータスPublished - 2010 2

ASJC Scopus subject areas

  • Electrochemistry

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