Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-identification

Kohei Miyase*, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara

*この研究の対応する著者

研究成果: Conference contribution

27 被引用数 (Scopus)

抄録

Test data modification based on test relaxation and X-filling is the preferable approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop reduction. In this paper, we propose a novel test relaxation method, called Distribution-Controlling X-Identification (DC-XID), which controls the distribution of X-bits identified from a set of fully-specified test vectors for the purpose of effectively reducing IR-drop. Experimental results on large industrial circuits demonstrate the effectiveness and practicality of the proposed method in reducing IR-drop, without any impact on fault coverage, test data volume, or test circuit size.

本文言語English
ホスト出版物のタイトル2008 IEEE/ACM International Conference on Computer-Aided Design Digest of Technical Papers, ICCAD 2008
ページ52-58
ページ数7
DOI
出版ステータスPublished - 2008
外部発表はい
イベント2008 International Conference on Computer-Aided Design, ICCAD - San Jose, CA, United States
継続期間: 2008 11月 102008 11月 13

出版物シリーズ

名前IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN(印刷版)1092-3152

Conference

Conference2008 International Conference on Computer-Aided Design, ICCAD
国/地域United States
CitySan Jose, CA
Period08/11/1008/11/13

ASJC Scopus subject areas

  • ソフトウェア
  • コンピュータ サイエンスの応用
  • コンピュータ グラフィックスおよびコンピュータ支援設計

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