Effects of crystallinity and electron mean-free-path on dielectric strength of low density polyethylene

Y. Tanaka*, N. Ohnuma, K. Katsunami, Y. Ohki

*この研究の対応する著者

研究成果: Conference article査読

2 被引用数 (Scopus)

抄録

The mean free path of photoinjected hot electrons in LDPE was obtained experimentally, and based on this result the relation between crystallinity and dielectric strength is discussed. The change in X-ray diffraction spectra of 50-μm-thick hot-pressed LDPE films of annealed at various temperatures is shown. The crystallinity of the film is improved as the annealing temperature increases. The relation between the dielectric strength and the annealing temperature of the hot-pressed film is shown. The dielectric strength decreases as the annealing temperature increases, as shown in measurements at room temperature and -50°C. The heat treatment improves the crystallinity and makes the mean free path longer, resulting in a lower dielectric strength.

本文言語English
ページ(範囲)545-550
ページ数6
ジャーナルConference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
出版ステータスPublished - 1990 10 1
イベント1990 Conference on Electrical Insulation and Dielectric Phenomena - Pocono Manor, PA, USA
継続期間: 1990 10 281990 10 31

ASJC Scopus subject areas

  • 電子工学および電気工学
  • 産業および生産工学
  • 建築および建設

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