Effects of internal micro-defects on diamond tool wear in precision cutting - Micro FT-IR analysis of internal micro-defects at the tool edge

T. Kaneeda, H. Torigoe, S. Shimada, K. Obata, L. Anthony, H. Iwashita

研究成果: Conference contribution

抄録

This paper details the relationship between tool wear properties and nitrogen impurities in diamond tools. Micro FT-IR analysis was carried out to determine the quantity of nitrogen impurities. The results show that nitrogen impurities significantly affect chipping and crater wear. Tools that contain more nitrogen impurities show less chipping. Crater wear volume corresponds to the quantity of nitrogen impurities in synthetic diamond tools and is affected by heat conduction and strength. Key words: diamond tool, precision cutting, Micro FT-IR, nitrogen impurities, chipping, crater wear, redox reaction.

本文言語English
ホスト出版物のタイトルProceedings - ASPE 2011 Annual Meeting
ページ369-372
ページ数4
出版ステータスPublished - 2011 12月 1
イベント26th Annual Meeting of the American Society for Precision Engineering, ASPE 2011 - Denver, CO, United States
継続期間: 2011 11月 132011 11月 18

出版物シリーズ

名前Proceedings - ASPE 2011 Annual Meeting
52

Conference

Conference26th Annual Meeting of the American Society for Precision Engineering, ASPE 2011
国/地域United States
CityDenver, CO
Period11/11/1311/11/18

ASJC Scopus subject areas

  • 工学(その他)

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