We report an electronic structure study on LaO1-xFxBiSe2 (x=0.18) by means of photoelectron spectromicroscopy. The Fermi surfaces and band dispersions are basically consistent with the band-structure calculations on BiS2-based materials, indicating that the electron correlation effects may be irrelevant to describe physics of the new BiSe2 system. In LaO1-xFxBiSe2 (x=0.18), the area of the Fermi pockets is estimated to be 0.16±0.02 per Bi, consistent with the amount of F substitution. Although the spectromicroscopy technique avoids the effect of microscale inhomogeneity for angle-resolved photoemission spectroscopy (ARPES), the ARPES spectral features are rather broad in the momentum space, indicating the likely effect of local disorder in the BiSe2 layer.
|ジャーナル||Physical Review B - Condensed Matter and Materials Physics|
|出版ステータス||Published - 2014 12月 19|
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