TY - JOUR
T1 - Energy distributions of field emitted electrons from a multi-wall carbon nanotube
AU - Takakura, Akihiro
AU - Hata, Koichi
AU - Saito, Yahachi
AU - Matsuda, Kohei
AU - Kona, Takayuki
AU - Oshima, Chuhei
PY - 2003/5
Y1 - 2003/5
N2 - Field emission energy distributions of electrons from one of the six pentagons located at the end of a multi-wall carbon nanotube have been measured by means of a high-resolution cylindrical energy analyzer. In a clean pentagon, the sub-peak was obtained at about 500meV below the main peak, exhibiting a shift with increasing applied voltage. For electrons emitted from an adsorbate onto the pentagon, no fine structure was observed in the spectra. The broadening of the leading edge was also observed for both clean and adsorbed pentagon, indicating the field penetration into the nanotube due to its semimetallic nature. The full-width at half-maximum was 280meV at the applied voltage of 660V and increased linearly with applied voltage.
AB - Field emission energy distributions of electrons from one of the six pentagons located at the end of a multi-wall carbon nanotube have been measured by means of a high-resolution cylindrical energy analyzer. In a clean pentagon, the sub-peak was obtained at about 500meV below the main peak, exhibiting a shift with increasing applied voltage. For electrons emitted from an adsorbate onto the pentagon, no fine structure was observed in the spectra. The broadening of the leading edge was also observed for both clean and adsorbed pentagon, indicating the field penetration into the nanotube due to its semimetallic nature. The full-width at half-maximum was 280meV at the applied voltage of 660V and increased linearly with applied voltage.
KW - Carbon nanotube
KW - Field emission
KW - Field emission energy distribution
KW - Surface electronic phenomena
UR - http://www.scopus.com/inward/record.url?scp=0037402588&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0037402588&partnerID=8YFLogxK
U2 - 10.1016/S0304-3991(02)00309-1
DO - 10.1016/S0304-3991(02)00309-1
M3 - Article
C2 - 12535557
AN - SCOPUS:0037402588
SN - 0304-3991
VL - 95
SP - 139
EP - 143
JO - Ultramicroscopy
JF - Ultramicroscopy
IS - SUPPL.
ER -