Error Correction Coding of Stochastic Numbers Using BER Measurement

研究成果: Conference contribution

1 引用 (Scopus)

抜粋

In electric circuits, errors are ineluctable. When upper bits of binary signals flip due to noise, the value will increase or decrease drastically. On the other hand, if stochastic numbers are used, the change on their values are the same since all the bits have the same weight. Therefore, stochastic computing, a computation method based on stochastic numbers, is attracting interest. Stochastic computing does have error tolerance, but cannot restore the bit stream if the bits are erroneous. Here, this paper focuses on evaluating the error-free value from the bit error rate and the erroneous value. In this paper, we propose a method to correct errors of stochastic numbers by measuring the bit error rate and filtering the values properly. From experimental evaluations, in environment with errors of more than 21%, this proposal will give a better peak-signal-to-noise ratio compared with a conventional error correction coding.

元の言語English
ホスト出版物のタイトル2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
編集者Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos
出版者Institute of Electrical and Electronics Engineers Inc.
ページ243-246
ページ数4
ISBN(電子版)9781728124902
DOI
出版物ステータスPublished - 2019 7
イベント25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 - Rhodes, Greece
継続期間: 2019 7 12019 7 3

出版物シリーズ

名前2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

Conference

Conference25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
Greece
Rhodes
期間19/7/119/7/3

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Networks and Communications
  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality

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  • これを引用

    Ishikawa, R., Tawada, M., Yanagisawa, M., & Togawa, N. (2019). Error Correction Coding of Stochastic Numbers Using BER Measurement. : D. Gizopoulos, D. Alexandrescu, P. Papavramidou, & M. Maniatakos (版), 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 (pp. 243-246). [8854450] (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IOLTS.2019.8854450