Estimation of delay test quality and its application to test generation

Seiji Kajihara*, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo

*この研究の対応する著者

研究成果: Conference contribution

9 被引用数 (Scopus)

抄録

As a method to evaluate delay test quality of test patterns, SDQM (Statistical Delay Quality Model) has been proposed for transition faults. In order to derive better test quality by SDQM, the following two things are important: for each transition fault, (1) to find out the accurate length of the longest sensitizable paths along which the fault is activated and propagated, and (2) to generate a test pattern that detects the fault through as long paths as possible. In this paper, we propose a method to calculate the length of the potentially sensitizable longest path for detection of a transition fault. In addition, we develop a procedure to extract path information that helps high quality transition ATPG. Experimental results show that the proposed method not only derives more accurate SDQL (Statistical Delay Quality Level) but also enhances the test quality of generated test patterns.

本文言語English
ホスト出版物のタイトル2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
ページ413-417
ページ数5
DOI
出版ステータスPublished - 2007
外部発表はい
イベント2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD - San Jose, CA, United States
継続期間: 2007 11月 42007 11月 8

出版物シリーズ

名前IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN(印刷版)1092-3152

Conference

Conference2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
国/地域United States
CitySan Jose, CA
Period07/11/407/11/8

ASJC Scopus subject areas

  • ソフトウェア
  • コンピュータ サイエンスの応用
  • コンピュータ グラフィックスおよびコンピュータ支援設計

引用スタイル