Estimation of phonon mean free path in small-scaled Si wire by monte carlo simulation

Yuhei Suzuki, Yuma Fujita, Khotimatul Fauziah, Takuto Nogita, Hiroya Ikeda, Takanobu Watanabe, Yoshinari Kamakura

研究成果: Conference contribution

抄録

A phonon transport in Si wire structures were simulated based on a Monte Carlo method to clarify the influence of the wire geometry and the surface roughness on thermal conductivity and the phonon-drag component of Seebeck coefficient. The mean free path (MFP) spectrum was estimated by tracing the simulated phonons. The MFPs of 1 THz phonons which mainly contribute to Seebeck coefficient become shorter with a decrease of the wire width for rough surfaces. This agrees with experimental observation of Seebeck coefficient. The MFPs of 3 THz phonons which mainly contribute to thermal conductivity were influenced even by small-roughness surfaces.

本文言語English
ホスト出版物のタイトル2020 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2020
出版社Institute of Electrical and Electronics Engineers Inc.
ページ15-18
ページ数4
ISBN(電子版)9784863487635
DOI
出版ステータスPublished - 2020 9 23
イベント2020 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2020 - Virtual, Kobe, Japan
継続期間: 2020 9 32020 10 6

出版物シリーズ

名前International Conference on Simulation of Semiconductor Processes and Devices, SISPAD
2020-September

Conference

Conference2020 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2020
国/地域Japan
CityVirtual, Kobe
Period20/9/320/10/6

ASJC Scopus subject areas

  • 電子工学および電気工学
  • コンピュータ サイエンスの応用
  • モデリングとシミュレーション

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